Skip to main content

Scanning Electron Microscope (SEM)

Instrument details

Model : Hitachi S-3400N
SEI Resolution : 3.0nm (30kV, in high vacuum) 10nm (3kV, in high vacuum)
BSEI Resolution : 4.0nm (3kV, in low vacuum)
Magnification : 5x to 300,000x
Accelerating Voltage : 300V to 30kV
  Working Principle SEM is a microscope which uses an electron beam to produce the surface image of the object with high magnification obtained by electromagnetic fields. The Hitachi 3400N VP-SEM is a Scanning Electron Microscope with tungsten filament allowing accelerating voltages up to 30kV. It is equipped with both Secondary (SE) and Backscatter (BSE) Electron Detectors and has a fully eccentric 5 axis motorized stage that allows samples up to 5cm in diameter. The Variable Pressure mode allows BSE observation from 6- 270Pa.

Contact Us

Name: Manish Roy
Technical Officer
Contact: 0547-2970733
Email: manish.roy@icar.gov.in

Name: Dr. Pawan Kr. Sharma
In-charge, NAIMCC
Contact: 0547-2970733
Email: pawan.sharma@icar.gov.in

Director
ICAR-NBAIM, Mau
Contact: 0547-2970727
Email: director.nbaim@icar.gov.in

Address:
National Agriculturally Important Microbial Culture Collection (NAIMCC)
ICAR-National Bureau of Agriculturally Important Microorganisms (ICAR-NBAIM)
Kushmaur, Maunath Bhanjan 275 103, Uttar Pradesh
Phone: 0547-2970727
Email: naimcc.nbaim@icar.gov.in, director.nbaim@icar.gov.in
Web: www.nbaim.icar.gov.in & www.mgrportal.org.in

SEM Instrument details and application form

Quick Enquiry
close slider